The characterization of these solar cell materials requires that researchers have the ability to investigate at the material, failure analysis, and device levels. Asylum Research atomic force microscopes and Nanoanalysis SEM based solutions provide platforms for all of the major types of PV materials and devices at every stage of their development. Our AFMs’ electrical characterization suite, combined with our broad platform set, and topped off by our wide array of software and hardware customization tools are unmatched in the AFM industry. Our EDS and EBSD detectors enable an in-depth structural and compositional characterisation of advanced solar cell materials.
AFM map of the photocurrent of a solar cell material
Thickness of layers in a thin film based solar cell measured using AZtec LayerProbe