Advanced EDS Elemental Analysis in SEM using BEX: Materials Science and Batteries

Dr. Haithem Mansour graduated with a PhD in Material Science from the University of Lorraine in France. He joined Oxford Instru...続きを読む >

Dr. Haithem Mansour graduated with a PhD in Material Science from the University of Lorraine in France. He joined Oxford Instruments in 2016 and has always worked with a strong focus in electron microscopy and microanalysis. Haithem has focused his research in ECCI, EBSD, EDS and BEX, in particular the development and improvement of these analytical techniques. He is currently working as X-ray Product Manager within the NanoAnalysis marketing team, where he helps design, develop and market new analytical systems.

Hiroshi Imoto joined JFE Techno-Research in 2002. He is a specialist in microstructural and elemental analysis using scanning e...続きを読む >

Hiroshi Imoto joined JFE Techno-Research in 2002. He is a specialist in microstructural and elemental analysis using scanning electron microscopes and EPMA. With extensive experience across fields such as metals, plastics, and electronic devices, he proposes the most suitable microbeam analytical methods to meet customer’s objectives. He has earned strong trust from many researchers and engineers in Japan. He is currently engaged in developing quantitative analysis techniques for BEX image data.

Masayasu Nagoshi joined Nippon Kokan (now JFE Steel) in 1986 and transferred to JFE Techno-Research in 2017. In 1994 he receive...続きを読む >

Masayasu Nagoshi joined Nippon Kokan (now JFE Steel) in 1986 and transferred to JFE Techno-Research in 2017. In 1994 he received his Doctor of Science degree from Tohoku University in Japan. He has consistently been engaged in the development of material characterization techniques using electron spectroscopy, electron microscopy, and synchrotron radiation techniques. Since being fascinated by Unity/BEX in 2023, he has been energetically developing applications of this technology across various material fields.