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Measurement of Polymer and Polymer Phase Properties

The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. It provides nanoscale information on a wide range of physical properties and behaviour in addition to imaging morphology. Whether investigating fundamental principles of polymer science or engineering a specific polymer solution (Figure 2), the AFM is a key instrument for evaluating polymers at small length scalesIts spatial resolution enables visualisation of sub-micrometer and sub-nanometer polymer morphology. But AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces, mapping mechanical, thermal, and electrical properties and assessing solvent and thermal effects in near real time.

ポリマー(高分子)研究のためのAFM

Measurement of Polymer and Polymer Phase Properties figure 1

ポリスチレン ‐ ポリカプロラクトン(PS-PCL)ブレンドの弾性率マップ。MFP-3D Infinity AFM の高速フォースマッピング(FFM)モードによるイメージ。

ポリマー(高分子)研究のためのAFM ナノ力学物性(機械的特性)計測のためのAFM Measuring Oil in Crystal Polystyrene Measuring Plasticiser Content in PVC Measuring Polybutadiene in Impact Polystyrene Measurement of Xylene Solubles in Polypropylene Simple, Rapid Determination of the Percentage of Polyoxyethylene (POE) in Poloxamers

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